PERSONAL DATA![]()
Personal Datas
Academic Background
Complementary Background
Profesional Background
Technical Background
Scientific Background
Teaching Background![]()
Ramon Fernandez RuizName:
Date of birth: 14 of May of 1969
Civil state: Married
Address: C/Port de la Cruz Verde Nº 2. 28770-Madrid. Spain
Telephone Home/Cellular: + 34 91 845 7258/+34 699024766
Email:
ramon.fernandez@uam.esPage WEB:
http://www.uam.es/ramon.fernandez![]()
ACADEMIC
BRACKGROUND (1)
Diplomate as
Chemical Specialist Technician:
Chemical Analyzes and Basic Processes. Polytechnic Institute of Cartagena,
Murcia. 1987/1988.
(2)
Graduated in Physical Sciences by the Autonomous University of Madrid. 1991/1998.(3)
Degree in Physical Sciences in the specialty of Theoretical Physics by the Autonomous University of Madrid. 1998/2003.(4)
Course of Doctorate with Mention of Quality: “Spectroscopy and its Applications”. Department of Physics of Materials. UAM. 2003/2004.(5)
Course of Doctorate with Mention of Quality: “Preparation and Characterization of Materials”. Department of Physics of Materials. UAM. 2003/2004.(6)
Course of Doctorate with Mention of Quality: “Photon”. Department of Physics of Materials. UAM. 2004/2005.(7)
Course of Doctorate with Mention of Quality: “Physical of Low temperatures”. Department of Physics of the Condensed matter. UAM. 2004/2005.(8)
Course of Doctorate with Mention of Quality: “The Light and Environment”. Department of Physics of Materials. UAM. 2004/2005.(9)
Degree of Advanced Studies in Physics of Materials (Masters in Sciences) with the work “Structural Anomaly of the LiNbO3 in the temperature rank 0-300K”, under the trusteeship of the Dra. Verónica Bermúdez. Department of Physics of Materials. UAM. 2006.(10)
Doctorate in Chemical Sciences. Doctoral thesis presented in the Department of Analytical Chemistry of the Autonomous University under Co-Direction of Prof. Dr Lucas Hernandez and Prof. Dr Jesus Tornero In Memoriam with the subject: “Application of the X-rays Fluorescence by Total Reflexion (TXRF) to the composicional analysis of archaeological ceramics”. UAM. 2008.
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COMPLEMENTARY BACKGROUND Courses of Formation (1)
Course of
Operator of Computer Science and
Programming BASIC. CEDED, Cartagena, Murcia 1986/87.
(2) Course of Formation like
Technician in Investigation. Autonomous Community of Madrid in collaboration with the Autonomous University of Madrid. Madrid, 1988/90.(3) Course of
Hyperchem celebrated during academic course 1993/94 in the UAM.(4) Course of
Operator of Radioactive Facilities, organized by the Center of Technology and Control of Quality (TECAL), authorized by the Nuclear Security Council. Scientific adviser: Dr Rafael Gaeta. Madrid, 1994.(5) Course of
Preparation of Samples by Microwaves for Metal Analysis, organized by Gomensoro, S.A. Scientific adviser Dra. Lois B. Jassie of the N.I.S.T. (The USA). Madrid,1995.(6) Course of
Analysis of Traces organized by Gomensoro, S.A. Madrid, 1996.(7) Course of formation on
First aid organized by the Brotherhood. Madrid, 1998.(8) Course of formation on
Prevention of fire organized by the Brotherhood. Madrid, 1998.(9) Course of
Introduction to the ICP-MS with the equipment of Perkin-Elmer Elan-6000,Scientific adviser Willi Barger, European Manager of ICP-MS applications. Salamanca, 1999.
(10) Course of
Management of the Quality in Research and Calibration Laboratories,Imparted by the Technological Center of Madrid (CETEMA). June, 2001.(11) Course of formation on
Prevention of fire and Plan of Security organized by ASEPEYO. Madrid, 2001.(12) Course of
Security in Laboratories organized by the Autonomous University of Madrid.Madrid. 2004.(13) Course of
Basic Electronics and Instrumentation organized by the Autonomous University of Madrid. 2007.(14) Course of
Characterization of Nanopartículas in Suspension organized by the Institute of Ceramics and Glass of the Superior Council of Scientific researches. ICV-CSIC. 2007.(15) Attendance to
WORKSHOP ON MAGNETIC NANOSYSTEMS FOR BIOTECHNOLOGY AND MEDICINE. Madrid, 2007.(16) Course of
Application of the Microwaves to the Digestion of Samples and the Synthesis of Materials organized by the Institute of Ceramics and Glass of the Superior Council of Scientific researches. ICV-CSIC. 2008.Knowledge of Computer Science
(1) Operative Environments D.O.S, Windows 95/98/2000/NT/XP and the VAX/VMS.
(2) Scientific Application programs: Origin, FullProff, GSAS, Ortep, Diamond.
(3) Treatment of images.
(4) Network Environments: Intranet, Internet, Electronic mail, FTP, telnet.
(5) Scientific Programming in VisualBasic 6.0.
(6) Advanced Knowledge of programming HTML for the design of WEB pages.
(7) Advanced Knowledge of Office: Word, Excell, FrontPage, PowerPoint.
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P
ROFESIONAL BACKGROUND(1) Contracted like Technician of Laboratory in Practices in the laboratories of Control y Calidad de Repsol S.A., during 6 months. Petroleum refinery of the Valley of Escombreras. Cartagena. Murcia, 1988.
(2) Contracted like
Official 1ª of Laboratory in the Chemistry-Physical Department of the Autonomous University of Madrid, during 19 months. UAM. Madrid, 1988/90.(3) Contracted like
Official 2ª of Laboratory in the Service of X-rays Diffraction of the Autonomous University of Madrid during 12 months. UAM. Madrid. 1990/91.(4) Contracted like
Specialist Technician in the Interdepartmental Service of Investigation of the Autonomous University of Madrid, Department of Diffraction and X-rays Fluorescence. Aid-Opposition made in 1991/2001. UAM. Madrid.(5) Contracted like
University Graduate in the Interdepartmental Service of Investigation of the Autonomous University of Madrid, Department of Diffraction and X-rays Fluorescence. Unit of Chemical Analysis. Ascent by merits in January of 2002. UAM. Madrid.(6) Contracted like
Superior Technichian in Spectroscopy and Spectrometry in the Interdepartmental Service of Investigation of the Autonomous University of Madrid, Department of Fluorescence of Rayos X (TXRF), Spectrometry of Masses with Inductively Coupled Plasma (ICP-MS), Ionic Chromatography (IC) and X-Ray Diffraction Cameras (XRDC). Unit of Chemical Analysis. Opposition made in 2003 and effective one at the present time. UAM. Madrid.![]()
(1) Repsol Petróleo S.A.
- Determination of parameters product physical-chemistries derived from petroleum.
- Gas Chromatography in slight components of gasolines.
- Atomic Absorption Spectroscopy (AAS) and Plasma Spectroscopy (ICP-OES) for the water metal determination of boilers and Zn in oils.
- Gravimetric, volumetric and conductimetrics Analyzes in waters.
(2) Department of Physical-Chemistry of the UAM.
- Systems of termostatización for precise XRD measures.
- Growth of crystals by fusion with germ (Czochralski) and gel.
- Characterization of crystalline phases in dust by the method of Debye.
- Precise Determination of lattice parameters in cubical crystalline systems by the method of Debye.
- Determination of crystallographic directions in monocrystals by the method of Laue. Systematic monocrystal study of Si.
- Determination of the degree of monocrystallinity and missorientation by direct reflection with laser and method of Laue.
- Revealed and positive of films for X-ray.
- Maintenance and Repair of X-rays generators (Philips and Seifert).
(3) Service of X-Ray of the UAM.
- Management and Organization of the Service.
- Thin Lamina Characterization and Superredes with difractómetros of 2 circles (Philips and Siemens).
- Study of Crystallographic Phase Transition of the TiH2 and TiD2 with 2 Circles diffractometer (Siemens D-500).
- Characterization of Crystalline Phases with 2 Circles diffractometer (Siemens D-500, D-5000, Philips PW).
- Measures of Sizes of Crystalline Dominions by Powder diffraction.
- Measures of Lattice Parameters with 2 Circles diffractometer.
- Programming of computer science applications for indexing of lines of diffraction, characterization of crystalline systems, precise measurement of lattice parameters and graphical modules for the interpretation of Rietveld spectrums.
- Use of Computer Science Packages for the refinement of crystalline structures by the method of Rietveld (DBWS, GSAS, ITO, FULLPROF…).
- Maintenance, calibration and repair of 2 Circles diffractometer. (Siemens D-500, D-5000 and Philips).
(4) Interdepartmental Service of Investigation (S.I.d.I).
- Management and Organization of the Laboratory of Total-reflection X-Ray Fluorescence (TXRF), Cameras of X-Ray Diffraction (Laue, Debye and Precession), Spectrometry of Masses with Inductively Coupled Plasma (ICP-MS) and Ionic Chromatography (IC).
- Installation of the TXRF equipment model EXTRA-II, Seifert & Co.
First equipment installed in Spain.- Design and coordination of the necessary infrastructure for the installation of the ICP-MS equipment model ELAN-6000, Perkin-Elmer.
- Design and coordination of the necessary infrastructure for the installation of an equipment of Ionic Chromatography DX-600, Dionex.
- Installation and calibration of the ICP-MS equipment model ELAN-6000, Perkin-Elmer.
- Installation and calibration of the Ionic Chromatograph DX-600, Dionex.
- Installation and calibration of the Automatic Diffractometer of 3 circles Siemens D-5000.
- Adjustment of the necessary infrastructure for the preparation of samples for TXRF, ICPMS and IC (Digestion by Microwaves, Water Purification, Systems of milling…).
- Completion and Design of Suitable Analytical Protocols to the techniques of TXRF, ICPMS and IC.
- Design of small material, adapted to the necessities that present the powder diffraction, the XRD cameras and the technique of TXRF.
- Maintenance, repair, alignment and calibration of the systems of TXRF, ICP-MS, XRD and IC.
- Design of system of laser alignment of laminar monocrystalline to make studies of crystalline perfection and degree of cut.
- Coordination of the process of accreditation in norm ISO 9001 of the laboratories of TXRF, IC, XRDC, Balances of precision and Ultrapure Water of the S.I.d.I.
- Relocation and installation of a 4 circles Siemens P4 goniometer and put in a 3 kW Mo X-ray line for special applications of diffraction in Physics of Materials.
- Installation of the TXRF equipment model 8030C, FEI-Atomika (Cameca).
Second equipment installed in Spain.- Installation of the instrument, for analysis of size particles distribution by laser diffraction, Malver Mastersize 2000.